Fig. 2
From: Spatial optimization of genetic thinning in seed orchards
The sum of diagonal elements of the \(\mathbf{\mathsf{PAIRS}}\) matrix (Y-axis) as a function of the genetic thinning intensity (0–40% ramets removed from the orchard, X-axis). The random reference line (RRL) is shown, i.e., the plot provides average values and 95% confidence intervals across 100 stochastic iterations. The ONA scenarios are not shown on the graph as the diagonal sum of \(\mathbf{\mathsf{PAIRS}}\) was always 0